功率半导体器件：封装、测试和可靠性
支持 36 个知识点邓二平、黄永章、丁立健 · 2024
来源
网站上的每条结论都标注了出处。这里列出全部 236 份参考资料，以及它们被用在哪些知识点。
显示 236 / 236 份资料
教材与专著33
微纳制造与半导体器件
支持 33 个知识点周圣军
Modern Semiconductor Devices for Integrated Circuits
支持 28 个知识点Chenming C. Hu · 2010
芯片制造：半导体工艺与设备
支持 24 个知识点陈译、陈铖颖、张宏怡
Physics of Semiconductor Devices
支持 24 个知识点S. M. Sze, Yiming Li, Kwok K. Ng · 第4版 · 2021
Integrated Circuit Fabrication: Science and Technology
支持 22 个知识点James D. Plummer, Peter B. Griffin · 2023 prepublication version · 2023
半导体物理学（第8版）
支持 20 个知识点刘恩科、朱秉升、罗晋生
数字集成电路：电路、系统与设计（第2版）
支持 15 个知识点Jan M. Rabaey, Anantha Chandrakasan, Borivoje Nikolić
The Physics of Semiconductors
支持 14 个知识点Marius Grundmann
模拟CMOS集成电路设计
支持 13 个知识点Behzad Razavi
彩图解入门半导体器件缺陷与失效分析技术精讲
支持 12 个知识点上田修、山本秀和
芯片设计：CMOS模拟集成电路设计与仿真实例（基于Cadence IC 617）
支持 9 个知识点李潇然、王兴华、陈志铭、张蕾
超大规模集成电路先进光刻理论与应用
支持 8 个知识点韦亚一 · 2016年6月第1版 · 2016
芯片制造：半导体工艺制程实用教程（第6版）
支持 8 个知识点Peter Van Zant 著；韩郑生等 译
衍射极限附近的光刻工艺
支持 8 个知识点伍强 等 · 2020年2月第1版 · 2020
CMOS模拟集成电路设计（第3版）
支持 8 个知识点Phillip E. Allen, Douglas R. Holberg
半导体存储器件与电路
支持 4 个知识点余诗孟
超大规模集成电路物理设计：从图分割到时序收敛
支持 3 个知识点Andrew B. Kahng 等 著；于永斌, 张徐亮, 徐宁等 译
Dynamic Calibration of Pressure Transducers
支持 1 个知识点Patrick S. Lederer · 1963
Physics for Device Simulations and Its Verification by Measurements
支持 1 个知识点Herbert S. Bennett, J. R. Lowney · 1994
半导体光催化原理及应用
支持 0 个知识点任彦荣、杨顶峰、李园园 主编
电子制造技术：利用无铅、无卤素和导电胶材料
支持 0 个知识点John H. Lau 等 著；姜岩峰, 张常年等 译
图解入门半导体工作原理精讲
支持 0 个知识点西久保靖彦
图解入门半导体元器件精讲
支持 0 个知识点执行直之
微电子学基础：机器人和生物工程应用（上，原书第3版）
支持 0 个知识点原书第3版（上册）
现代集成电路半导体器件
支持 0 个知识点胡正明 著；王燕、张莉、叶佐昌等 译
CMOS VLSI Design
支持 0 个知识点Hetal Gosavi · 2020
University Physics Volume 3（OpenStax）
支持 0 个知识点OpenStax · 2021
标准与规范11
AEC-Q101 Rev. E: Failure Mechanism Based Stress Test Qualification for Discrete Semiconductors
支持 4 个知识点Automotive Electronics Council · 2021
AQG 324: Qualification of Power Modules for Use in Power Electronics Converter Units in Motor Vehicles
支持 3 个知识点ECPE Working Group Automotive Power Module Qualification · 2025
NASA-STD-7002B with Change 1: Payload Test Requirements
支持 3 个知识点National Aeronautics and Space Administration · 2025
I/O Buffer Information Specification Version 8.0
支持 2 个知识点IBIS Open Forum · 2025
Qualification tests and standards conducted for Infineon IGBT modules
支持 2 个知识点Infineon Technologies AG · 2024
Standard Reference Materials for Spreading Resistance Measurements on Semiconductor Silicon
支持 2 个知识点National Bureau of Standards · 1984
AEC-Q102 Rev A: Failure Mechanism Based Stress Test Qualification for Optoelectronic Semiconductors
支持 1 个知识点AEC Component Technical Committee · 2020
IBIS Quality Specification Version 2.0
支持 1 个知识点IBIS Open Forum Quality Task Group · 2026
RISC-V Instruction Set Architecture Manuals
支持 1 个知识点RISC-V International · 2026
Surface Data: XPS and AES Reference Databases
支持 1 个知识点NIST Standard Reference Data Program · 2024
论文43
Core-Shell p-i-n GaN Nanowire LEDs by N-polar Selective Area Growth
支持 4 个知识点Matthew D. Brubaker et al. · 2018
High-brightness lasing at submicrometer enabled by droop-free fin light-emitting diodes
支持 3 个知识点Robin P. Hansen et al. · 2020
Performance Degradation of GaN HEMTs Under Accelerated Power Cycling Tests
支持 3 个知识点Chi Xu, Fei Yang, Enes Ugur, Shi Pu, Bilal Akin · 2018
Adhesion between Template Materials and UV-Cured Nanoimprint Resists
支持 2 个知识点Frances A. Houle et al. · 2006
Analysis of Contact Interfaces for Single GaN Nanowire Devices
支持 2 个知识点Andrew M. Herrero, Paul T. Blanchard, Kristine A. Bertness · 2013
Design of Experiments Approach to Verification of a Finite Element Model
支持 2 个知识点NIST researchers and collaborators · 2008
Dopant Characterization Round-Robin Study Performed on Two-Dimensional Test Structures
支持 2 个知识点J. Vahakangas et al. · 1998
Fabrication and characterization of a SiC/SiO2/Si piezoresistive pressure sensor
支持 2 个知识点Mariana A. Fraga et al. · 2010
First Principles Phase Diagram Calculations for the Wurtzite-Structure Systems AlN-GaN, AlN-InN and GaN-InN
支持 2 个知识点A. Van de Walle, B. P. Burton, U. R. Kattner · 2006
In situ Metrology During the Growth of Compound Semiconductors by Molecular Beam Epitaxy
支持 2 个知识点NIST researchers · 2000
Numerical Solution of Initial Boundary Value Problems Involving Maxwell's Equations in Isotropic Media
支持 2 个知识点Kane S. Yee · 1966
Optimal design of SiC piezoresistive pressure sensor considering material anisotropy
支持 2 个知识点Jiahao Wu et al. · 2020
Reliability of Semiconductor Laser Packaging in Space Applications
支持 2 个知识点Ivair Gontijo, Yueming Qiu, Andrew A. Shapiro · 2008
Repetitive Short Circuit Behaviour of Trench-/Field-Stop IGBTs
支持 2 个知识点Infineon Technologies · 2003
Research on Temperature Zero Drift of SiC Piezoresistive Pressure Sensor Based on Asymmetric Wheatstone Bridge
支持 2 个知识点Bing Tian et al. · 2022
Residual Layer Thickness Control and Metrology in Jet and Flash Imprint Lithography
支持 2 个知识点Ravikiran Attota, Shrawan Singhal, S. V. Sreenivasan · 2012
Self-Calibrating TSEP for Junction Temperature and RUL Prediction in GaN HEMTs
支持 2 个知识点Yifan Wang et al. · 2025
Simple Turn-off Description of Trench-Field-Stop IGBT – IGBT3/3.3 kV
支持 2 个知识点Infineon Technologies · 2012
Studies of the Distribution of Elementary Threading Screw Dislocations In 4H Silicon Carbide Wafer
支持 2 个知识点National Institute of Standards and Technology · 2014
300A 650V 70 µm Thin IGBTs with Double-Sided Cooling
支持 1 个知识点Hsueh-Rong Chang, Jiankang Bu, George Kong, Ricky Labayen · 2010
A Perfectly Matched Layer for the Absorption of Electromagnetic Waves
支持 1 个知识点Jean-Pierre Berenger · 1994
Autodoping of Antimony and Arsenic in Silicon Epitaxial Layers
支持 1 个知识点P. Katona · 1983
Avalanche Breakdown in Germanium
支持 1 个知识点S. L. Miller · 1955
Deep-UV Photoemission Electron Microscopy for Imaging Nanoscale Heterogeneity and Defects in GaN
支持 1 个知识点National Institute of Standards and Technology · 2023
Design and Demonstration of PECVD Angled Multilayer Dielectric Mirrors Optimized for Micromachined Cavity Sidewalls
支持 1 个知识点M. A. Perez, John Kitching, A. Shkel · 2008
Development of SiC Large Diameter Seedless Crystals
支持 1 个知识点NASA Glenn Research Center · 2015
Epitaxial Growth of Rhenium with Sputtering
支持 1 个知识点Seongshik Oh et al. · 2005
FEM-Aided Damage Model Calibration Method For Experimental Results
支持 1 个知识点Mikkel Brønnum Fogsgaard, Francesco Iannuzzo · 2020
GaN/AlGaN Ultraviolet Avalanche Photodiodes Grown by MOCVD
支持 1 个知识点NASA and collaborators · 2020
InN Layers Grown by HVPE
支持 1 个知识点A. Syrkin et al. · 2021
Macro–Mesoscale Modeling of the Evolution of the Surface Roughness of the Al Metallization Layer of an IGBT Module during Power Cycling
支持 1 个知识点A. Kováčová et al. · 2023
Mechanisms of Heavy Ion-Induced Single Event Burnout in 4H-SiC Power MOSFETs
支持 1 个知识点Joseph A. McPherson, Collin Hitchcock, T. Paul Chow, Wei Ji, Andrew A. Woodworth · 2019
Model for Power Cycling Lifetime of IGBT Modules – Various Factors Influencing Lifetime
支持 1 个知识点Reinhold Bayerer, Tobias Herrmann, Thomas Licht, Josef Lutz, Marco Feller · 2008
New Phenomenon in Narrow Germanium p-n Junctions
支持 1 个知识点Leo Esaki · 1958
Observation of Monolayer and Bilayer Period RHEED Oscillations During Epitaxial Growth on Ge and Ge(100)
支持 1 个知识点C. L. Berrie, S. R. Leone · 2000
Optimization of the Thermal Contact Resistance within Press Pack IGBTs
支持 1 个知识点Erping Deng, Zhibin Zhao, Peng Zhang, Yongzhang Huang, Jinyuan Li · 2017
Power Cycling – Methods, Measurement Accuracy, Comparability
支持 1 个知识点Josef Lutz · 2020
Process-Induced Morphological Defects in Epitaxial CVD Silicon Carbide
支持 1 个知识点NASA Glenn Research Center · 2000
Relaxation of Strained-Layer Semiconductor Structures via Plastic Flow
支持 1 个知识点B. W. Dodson, J. Y. Tsao · 1987
Reliability and Performance Limitations in SiC Power Devices
支持 1 个知识点National Institute of Standards and Technology · 2000
Selective Area Growth and Structural Characterization of GaN Nanostructures on Si(111) Substrates
支持 1 个知识点National Institute of Standards and Technology · 2018
Space Radiation Effects on SiC Power Device Reliability
支持 1 个知识点Jean-Marie Lauenstein et al. · 2021
Transmission Electron Microscopy Study of a Defected Zone in GaN on a SiC Substrate Grown by Hydride Vapor Phase Epitaxy
支持 1 个知识点Leonid A. Bendersky, Denis Tsvetkov, Y. Melnik · 2003
研究机构资料28
2022 Solid-State Lighting R&D Opportunities
支持 5 个知识点U.S. Department of Energy · 2022
Multiscale Modeling and Validation of Semiconductor Materials and Devices
支持 5 个知识点NIST Semiconductor Metrology Program · 2026
Charon User Manual: Semiconductor Device Simulation
支持 4 个知识点Sandia National Laboratories · 2021
Examination of Advanced Technologies in Semiconductor Device Failure Analysis
支持 4 个知识点Advantest Corporation · 2017
Sesame: Optoelectronic Modeling in Multiple Dimensions
支持 4 个知识点NIST researchers · 2026
Metrology for Nanoimprint Lithography
支持 3 个知识点National Institute of Standards and Technology · 2008
Semiconductor Metrology and 3D Chemical and Structural Imaging
支持 3 个知识点National Institute of Standards and Technology · 2025
Advancing Power Electronics with Defect Metrology
支持 2 个知识点National Institute of Standards and Technology · 2026
DLMF §25.12(iii): Fermi–Dirac and Bose–Einstein Integrals
支持 2 个知识点NIST Digital Library of Mathematical Functions · 2026
Quantitative Assessment of Defects and Related Modeling Parameters in GaN Semiconductor Devices
支持 2 个知识点National Institute of Standards and Technology · 2024
Advanced Packaging Technology Used in Fabricating a High-Temperature Silicon Carbide Pressure Sensor
支持 1 个知识点Robert S. Okojie et al. · 2005
Appendix Four: Failure Analysis
支持 1 个知识点NASA Jet Propulsion Laboratory · 2026
Atom Probe Tomography: Nanostructured Semiconductor Materials, Interfaces, and Devices
支持 1 个知识点NIST Material Measurement Laboratory · 2025
Atomic-force microscopy
支持 1 个知识点NIST Nanostructure Fabrication and Measurement Group · 2025
Defect Modeling in Semiconductors: The Role of First Principles Simulations and Machine Learning
支持 1 个知识点A. Mannodi-Kanakkithodi et al. · 2025
Diffraction Metrology and Standards
支持 1 个知识点James P. Cline et al. · 2025
Electrical and Thermal Characterization, Modeling, and Reliability Assessment of Power Semiconductor Modules
支持 1 个知识点Allen R. Hefner Jr. · 2009
Electrical Scanning Probe Microscopy
支持 1 个知识点National Institute of Standards and Technology · 2019
Fiber Optic Test Procedures
支持 1 个知识点National Institute of Standards and Technology · 1990
Magnetic Sector Secondary Ion Mass Spectrometry
支持 1 个知识点NIST Chemical Sciences Division · 2025
NIST/SEMATECH e-Handbook of Statistical Methods: Reliability
支持 1 个知识点NIST/SEMATECH · 2012
Raman Metrology and Instrumentation
支持 1 个知识点NIST Material Measurement Laboratory · 2025
Scanning-electron microscopy
支持 1 个知识点NIST Nanostructure Fabrication and Measurement Group · 2025
Semiconductor Measurement Technology
支持 1 个知识点National Bureau of Standards Semiconductor Technology Program · 1976
Semiconductor Measurement Technology: Resistivity-Dopant Density Relationships for Silicon
支持 1 个知识点National Bureau of Standards Semiconductor Technology Program · 1976
Semiconductor Measurement Technology: Temperature Dependence of Combined Density-of-States, Conductivity, and Hall Effective Mass of Holes in p-Type Silicon
支持 1 个知识点L. C. Linares, S. S. Li et al. · 1978
Semiconductor Technology for the Non-Technologist, Second Edition
支持 1 个知识点Robert I. Scace · 1990
Thermal Property Measurements for Semiconductors and Energy Materials
支持 1 个知识点National Institute of Standards and Technology · 2026
厂商技术资料110
Overcoming Receiver Test Challenges in Gen4 I/O Applications
支持 5 个知识点Tektronix · 2024
Advanced SerDes Debug with a BERT
支持 4 个知识点Tektronix · 2024
PC and TC Diagrams
支持 4 个知识点Infineon Technologies · 2021
Applying Error Correction to Vector Network Analyzer Measurements
支持 3 个知识点Keysight Technologies · 2025
Basic Linear Design, Chapter 4: RF/IF Circuits
支持 3 个知识点Walt Kester (ed.) · 2006
Clock Recovery Primer, Part 2
支持 3 个知识点Tektronix · 2024
Conformance Testing of 800G Ethernet Links for the Data Center
支持 3 个知识点Keysight Technologies · 2025
Evaluating DC-DC Converters and Passive PDN Components
支持 3 个知识点Keysight Technologies · 2025
How Infineon controls and assures the reliability of SiC based power semiconductors
支持 3 个知识点Infineon Technologies AG · 2020
Industrial IGBT Modules: Explanation of Technical Information
支持 3 个知识点Infineon Technologies · 2015
Simulating High-Speed Serial Channels with IBIS-AMI Models
支持 3 个知识点Keysight Technologies · 2025
The MEMS Module
支持 3 个知识点COMSOL · 2025
TRENCHSTOP 5 S5 Discrete IGBT
支持 3 个知识点Infineon Technologies AG · 2015
Understanding the Fundamental Principles of Vector Network Analysis
支持 3 个知识点Keysight Technologies · 2020
10 Hints for Making Better Network Analyzer Measurements
支持 2 个知识点Keysight Technologies · 2014
1200 V CoolSiC MOSFET: Trench Power Device
支持 2 个知识点Infineon Technologies · 2024
About AMI
支持 2 个知识点Keysight Technologies · 2026
AN-140: Basic Concepts of Linear Regulator and Switching Mode Power Supplies
支持 2 个知识点Analog Devices · 2026
AN-884: Integrated LNA and Mixer Basics
支持 2 个知识点A. Dao · 1993
AN058: Antenna Selection Guide
支持 2 个知识点Kjetil Holger A. Furset · 2017
Base Packaging Technologies
支持 2 个知识点Semikron Danfoss · 2026
Channel Operating Margin Quick Start
支持 2 个知识点Keysight Technologies · 2026
Correlation between VNA and TDR/TDT Extracted S-Parameters
支持 2 个知识点Tektronix · 2004
Cortex-M4 Devices Generic User Guide
支持 2 个知识点Arm · 2010
Double Sided Sintering Technology
支持 2 个知识点Semikron Danfoss · 2026
FDTD Solver Simulation Object
支持 2 个知识点Ansys Optics · 2026
Green-box Testing: A Method for Optimizing High-speed Serial Links
支持 2 个知识点Casey Morrison · 2016
High-Speed Board Design Advisor: Power Distribution Network
支持 2 个知识点Intel / Altera · 2025
Incoherent Unpolarized Dipole
支持 2 个知识点Ansys Optics · 2026
Jitter Fundamentals: Sources, Types, and Characteristics
支持 2 个知识点Keysight Technologies · 2026
Jitter Measurements and Instrument Selection
支持 2 个知识点Keysight Technologies · 2025
Jitter Timing Fundamentals
支持 2 个知识点Tektronix · 2026
LightTools Illumination Design Software Feature Details
支持 2 个知识点Synopsys · 2025
Network Analysis Measurement Fundamentals
支持 2 个知识点Keysight Technologies · 2026
Optimize Power Distribution Networks for Flat Impedance
支持 2 个知识点Keysight Technologies · 2025
RF Demystified—Understanding Wave Reflections
支持 2 个知识点Eamon Nash · 2021
Semiconductor Failure Analysis
支持 2 个知识点Hamamatsu Photonics K.K. · 2026
SWRA479A: Achieving Optimum Radio Range
支持 2 个知识点Richard Wallace · 2017
The Semiconductor Interface
支持 2 个知识点COMSOL · 2025
Understanding IBIS-AMI Simulations
支持 2 个知识点MathWorks · 2026
Z-Wave 800 Series Integration Guide: Matching Circuit
支持 2 个知识点Silicon Labs · 2025
A DAC for All Precision Occasions
支持 1 个知识点Bonnie C. Baker · 2008
Accurate Test Fixture Characterization and De-embedding
支持 1 个知识点Rohde & Schwarz · 2024
ADALM-PLUTO Receiver Sensitivity
支持 1 个知识点Robin Getz / Analog Devices University Program · 2019
AN-1438: A Simple Method to Reduce DC Power Consumption in CDMA RF Power Amplifiers
支持 1 个知识点National Semiconductor Applications Engineering · 2013
AN3081: IS2083 Reference Design Application Note
支持 1 个知识点Microchip Technology · 2023
Analyzing 26 to 53 GBd PAM4 Optical and Electrical Signals
支持 1 个知识点Tektronix · 2018
Ask The Applications Engineer-21: Capacitance and Capacitors
支持 1 个知识点Analog Devices · 2026
BER – Is it Bit Error Rate or Bit Error Ratio?
支持 1 个知识点Nicole Faubert · 2019
Cosmic Radiation Effects on High-Voltage Semiconductors in Automotive Onboard Chargers
支持 1 个知识点Infineon Technologies AG · 2021
CUDA Programming Guide
支持 1 个知识点NVIDIA · 2026
Does GaN Have a Body Diode? Understanding Third-Quadrant Operation
支持 1 个知识点Texas Instruments · 2019
Double-Pulse Testing Using a Keysight Function Generator
支持 1 个知识点Keysight Technologies · 2025
Error Analysis of PAM4 Signals
支持 1 个知识点Keysight Technologies · 2024
Error Vector Magnitude: The Heart of Everything Wireless
支持 1 个知识点Keysight Technologies · 2025
Fundamentals of MOSFET and IGBT Gate Driver Circuits (Rev. A)
支持 1 个知识点László Balogh · 2018
Getting Started with COMSOL Multiphysics
支持 1 个知识点COMSOL · 2026
How Digitally Tunable Filters Enable Wideband Receiver Applications
支持 1 个知识点Peter Delos / Michael Jones · 2022
IEEE 802.3cb Channel Operating Margin Tutorial
支持 1 个知识点Richard Mellitz · 2016
Impedance Matching and Smith Chart Impedance
支持 1 个知识点Analog Devices · 2023
Jitter and Noise Decomposition
支持 1 个知识点Rohde & Schwarz · 2025
LDO Basics: A Complete LDO Design Guide
支持 1 个知识点Texas Instruments · 2026
LDO Performance Near Dropout
支持 1 个知识点Texas Instruments · 2025
Linear Mode Operation and Safe Operating Diagram of Power MOSFETs
支持 1 个知识点Infineon Technologies · 2017
Loop Stability Analysis of Voltage Mode Buck Regulator
支持 1 个知识点Texas Instruments · 2025
M8091BMCA Receiver Conformance Test Application User Guide
支持 1 个知识点Keysight Technologies · 2026
MT-001: Taking the Mystery out of SNR = 6.02N + 1.76dB
支持 1 个知识点Walt Kester · 2008
MT-003: Understand SINAD, ENOB, SNR, THD and SFDR
支持 1 个知识点Walt Kester · 2008
MT-010: The Importance of Data Converter Static Specifications
支持 1 个知识点Walt Kester · 2009
MT-014: Basic DAC Architectures I - String DACs and Thermometer DACs
支持 1 个知识点Walt Kester · 2009
MT-015: Basic DAC Architectures II - Binary DACs
支持 1 个知识点Walt Kester · 2009
MT-016: Basic DAC Architectures III - Segmented DACs
支持 1 个知识点Walt Kester · 2009
MT-019: DAC Interface Fundamentals
支持 1 个知识点Walt Kester · 2009
MT-020: ADC Architectures I - The Flash Converter
支持 1 个知识点Walt Kester · 2008
MT-021: ADC Architectures II - Successive Approximation ADCs
支持 1 个知识点Walt Kester · 2008
MT-086: Fundamentals of Phase Locked Loops (PLLs)
支持 1 个知识点Walt Kester · 2009
MT-094: Microstrip and Stripline Design
支持 1 个知识点Walt Kester · 2009
OptiMOS Power MOSFET Datasheet Explanation
支持 1 个知识点Infineon Technologies · 2012
Performing a Mesh Refinement Study
支持 1 个知识点COMSOL · 2026
Performing Eye-diagram Mask Testing
支持 1 个知识点Keysight Technologies · 2026
PolarFire SoC PCIe Reference Clock
支持 1 个知识点Microchip Technology · 2025
Power Amplifier Theory for High-Efficiency Low-Cost ISM-Band Transmitters
支持 1 个知识点Maxim Integrated Applications Engineering · 2005
Power MOSFET Basics and Loss Estimation
支持 1 个知识点Infineon Technologies · 2026
Power Supply Sequencing Simplified
支持 1 个知识点Nathan Enger · 2016
Power Supply Sequencing Solutions for Dual Supply Voltage DSPs
支持 1 个知识点Texas Instruments · 2025
Precision DACs: AC Specifications
支持 1 个知识点Texas Instruments Precision Labs · 2015
Precision DACs: DC Specifications
支持 1 个知识点Texas Instruments Precision Labs · 2015
R&S ZVT Vector Network Analyzers Getting Started
支持 1 个知识点Rohde & Schwarz · 2026
Radio Frequency Impedance Matching: Calculations and Simulations
支持 1 个知识点Analog Devices Applications Engineering · 2023
Radio Link-Budget Calculations for ISM-RF Products
支持 1 个知识点Maxim Integrated Applications Engineering · 2002
ROCm GPU Architecture Documentation
支持 1 个知识点AMD · 2026
Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR
支持 1 个知识点Keysight Technologies · 2025
Signal Integrity Simulation Using Advanced Design System
支持 1 个知识点Keysight Technologies · 2025
Simultaneous-Switching Performance of TI Logic Devices
支持 1 个知识点Texas Instruments · 2025
Specifying Calibration Standards and Kits for Vector Network Analyzers
支持 1 个知识点Keysight Technologies · 2025
STM32F103C8 Product Documentation
支持 1 个知识点STMicroelectronics · 2026
TDR Impedance Measurements: A Foundation for Signal Integrity
支持 1 个知识点Tektronix · 2026
The 1200 V TRENCHSTOP IGBT7 S7 and EC7 technology, portfolio and applications
支持 1 个知识点Infineon Technologies AG · 2023
The Importance of Accurate S-Parameters for PAM-4 Applications
支持 1 个知识点Rohde & Schwarz · 2020
The Usage of Form Union and Form Assembly
支持 1 个知识点COMSOL · 2026
Understanding Error Vector Magnitude
支持 1 个知识点Paul Denisowski · 2026
Understanding S-parameters
支持 1 个知识点Rohde & Schwarz · 2025
Understanding the Smith chart
支持 1 个知识点Rohde & Schwarz · 2025
开放资源7
CMOS（Wikipedia）
支持 2 个知识点Wikipedia contributors · 2026
Register-transfer level（Wikipedia）
支持 1 个知识点Wikipedia contributors · 2026
Diamond cubic（Wikipedia）
支持 0 个知识点Wikipedia contributors · 2026
Etching (microfabrication)（Wikipedia）
支持 0 个知识点Wikipedia contributors · 2026
MOSFET（Wikipedia）
支持 0 个知识点Wikipedia contributors · 2026
Photolithography（Wikipedia）
支持 0 个知识点Wikipedia contributors · 2026
Wafer (electronics)（Wikipedia）
支持 0 个知识点Wikipedia contributors · 2026
其他资料4
L Series IPMs: Low Loss, Low Noise, New Control
支持 2 个知识点Mitsubishi Electric · 2004
IEEE 802.3 Channel Operating Margin Open Source Project
支持 1 个知识点IEEE 802.3 COM Ad Hoc · 2026
Miller Indices
支持 1 个知识点International Union of Crystallography · 2017
Reciprocal Lattice
支持 1 个知识点International Union of Crystallography · 2026