Performance Degradation of GaN HEMTs Under Accelerated Power Cycling Tests
Chi Xu, Fei Yang, Enes Ugur, Shi Pu, Bilal Akin
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CPSS TPEA 3(4), pp.269–278，setup, monitored parameters and failure analysis
Chi Xu, Fei Yang, Enes Ugur, Shi Pu, Bilal Akin
CPSS TPEA 3(4), pp.269–278，setup, monitored parameters and failure analysis