Space Radiation Effects on SiC Power Device Reliability
Jean-Marie Lauenstein et al.
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IEEE IRPS 2021 pp.1–8，§§II–IV test methods, degradation, catastrophic failure and assurance
Jean-Marie Lauenstein et al.
IEEE IRPS 2021 pp.1–8，§§II–IV test methods, degradation, catastrophic failure and assurance