Analysis of Contact Interfaces for Single GaN Nanowire Devices

Andrew M. Herrero, Paul T. Blanchard, Kristine A. Bertness

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NIST publication §§Abstract–Procedure，contact removal, voids, cracking, delamination and residual contamination
LED 透明接触、电流扩展与反射镜/DBR LED 台面侧壁、钝化、粗化与制造验证