Self-Calibrating TSEP for Junction Temperature and RUL Prediction in GaN HEMTs
Yifan Wang et al.
本站引用的位置1 处，涉及 2 个知识点
Nanomaterials 15(14), 1102，§§2–4 gate-leakage TSEP, aging calibration and RDS(on) monitoring
Yifan Wang et al.
Nanomaterials 15(14), 1102，§§2–4 gate-leakage TSEP, aging calibration and RDS(on) monitoring