Mechanisms of Heavy Ion-Induced Single Event Burnout in 4H-SiC Power MOSFETs
Joseph A. McPherson, Collin Hitchcock, T. Paul Chow, Wei Ji, Andrew A. Woodworth
本站引用的位置1 处，涉及 1 个知识点
p.1，sections Strike Locations, SEB Failure Mechanism and Proposed Designs